The Detection of Doped Cr Presence in Sr(0.6)Ba(0.4)Nb2O3 by SIMS

Report No. ARL-TN-132
Authors: Lee, Unchul
Date/Pages: May 1999; 12 pages
Abstract: Photorefractive materials like SrBaNb (SBN) have optical properties that can have several military applications. To improve the figures of merit for these materials, it is very important to have better control of Cr dopant in the SBN. Since the amount of Cr dopant is so small, the usual analytical techniques are not adequate to analyze this material. In this report, the incorporation of Cr into SBN using secondary ion mass spectrometry (SIMS) measurement with an electron gun is confirmed.
Distribution: Approved for public release
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Last Update / Reviewed: May 1, 1999