Capacitive Discharge Circuit for Surge Current Evaluation of SiC

Report No. ARL-TN-0376
Authors: Mark R. Morgenstern
Date/Pages: November 2009; 10 pages
Abstract: The power components branch has constructed an apparatus used for surge current testing of prototype semiconductor switch devices. The test apparatus is small-scale. It provides a 1 J pulse at a 5-25¿S pulse width. Shoot-through is a concern in many of the power conversion applications and the pulse provided by this apparatus can provide a very useful model of what device behavior to expect when shoot-through currents occur. Other device characteristics that can also be measured with this apparatus are: maximum current rise rate, forward transconductance, high voltage blocking, required gate charge, and safe operating area.
Distribution: Approved for public release
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Last Update / Reviewed: November 1, 2009