Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples

Report No. ARL-TR-4166
Authors: Joshua C. Crone, Santiago Solares, and Peter W. Chung
Date/Pages: June 2007; 20 pages
Abstract: This report was generated as part of a Student Temporary Employment Program Internship from July 2006 through June 2007. The report presents basic didactic concepts and reviews recent progress in the scientific literature on atomic force microscopy (AFM). A new AFM technique is studied. The novel AFM approach is based on force and frequency modulation (FFM-AFM) that enables nondestructive AFM measurements of soft samples such as biological materials in solution. The vibrational properties of the AFM cantilever probe are examined to determine extremal conditions that the sample is likely to experience.
Distribution: Approved for public release
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Last Update / Reviewed: June 1, 2007