Evaluation of an Electronic Load for Pulsed Current Characterization of Power Semiconductors

Report No. ARL-TR-5348
Authors: Timothy E. Griffin
Date/Pages: September 2010; 16 pages
Abstract: An electronic load was evaluated for outputting a pulse of a controlled value of current from a power supply, for consideration for measuring a device-under-test (DUT). A large Dynaload load containing insulated gate bipolar transistors (IGBTs) was used without a DUT but was rejected due to poor performance. In constant current mode, the load's pulses of I(t) had undesirable off-state leakage. Its I(t) pulse had slow rise, odd shape, and inadequate reproducibility for calibrated measurements. The load was rated merely 600 V, hence, during a pulse, could include a VDS of less than 600 V.
Distribution: Approved for public release
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Last Update / Reviewed: September 1, 2010