A Dihedral Sample Mount for Off-Normal RAM Performance Measurements

Report No. ARL-TR-2049
Authors: Bossoli, Robert B.
Date/Pages: September 1999; 35 pages
Abstract: A novel sample mount has been designed for making high angle of incidence radar absorbing material (RAM) sample performance measurements. The sample mount allows for ^ 47 degrees angle of incidence measurement of RAM millimeter-wave (MMW) reflectivity (performance). Measurements are taken from 26-60 GHz and 75-100 GHz in the U.S. Army Research Laboratory's (ARL) Weapons and Materials Research Directorate (WMRD) Composites and Lightweight Structures Branch (CLSB) anechoic chamber. RAM samples can also be mounted in a full dihedral configuration for simulation of RAM performance in double bounce (corner)-type locations. Performance of two commercial-type RAM materials was measured at close to normal and at the ^ 47 degrees off-normal angles of incidence. A full dihedral covered with one of the commercial RAMs was also tested. The mount will allow for more realistic evaluation of ARL- and contractor-designed RAM and other coatings to be utilized in low-observable Army and Department of Defense (DOD) projects.
Distribution: Approved for public release
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Last Update / Reviewed: September 1, 1999