Improving Microbolometric Response using Carbon Nanotubes

Report No. ARL-TN-0523
Authors: Nichelle Perera and Priyalal Wijewarnasuriya
Date/Pages: January 2013; 14 pages
Abstract: Single-walled carbon nanotubes (CNTs) provide a semiconductor material with high sensitivity, detectivity, and a high temperature coefficient of resistance (TCR), in comparison to previously used vanadium oxide microbolometers, to detect infrared radiation. The fabrication of the microbolometer uses photolithography and metal deposition processes to create electrical contact pads on the nanotubes, and mounting and wire bonding to a leadless chip carrier. Once fabricated, an experimental dewar is used to test the device at varying temperatures, ranging from 78 K to room temperature. The results indicate that using a semiconductor material with a higher TCR provides a wider range of electrical resistance, and improves the sensitivity and response of infrared imaging technology.
Distribution: Approved for public release
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Last Update / Reviewed: January 1, 2013