Non-Kinetic Protection

Susceptibility Analysis

We are studying electronic circuits and subsystems to evaluate their reliability under a variety of electromagnetic field conditions. Our device forensics capability enables us to analyze and quantify the impact on electronic circuits of (1) direct probe-based waveform injection, and (2) polarization- and amplitude-controlled electromagnetic fields using reverberation and anechoic chambers, and a transverse electromagnetic cell.

Principal Investigators:

Dr. Charles Dietlein charles.r.dietlein.civ@mail.mil 301-394-0931