ARL Science Talk: "Multiscale Transport Modeling Dr. Brent Kraczek"

February 07, 2018

The development of future semiconductor sensors and communications devices will be enhanced by the co-development of materials and structures. We seek to employ multiscale modeling to represent the features of the semiconductor devices, the macroscale, while simultaneously including the carrier response of the specific material components, the microscale. The current, Monte-Carlo-based microscale methods for material-specific photo-excited carrier dynamics would generate far too many degrees of freedom (d.o.f.) to allow such a calculation to be computationally tractable. In the present talk we discuss the data methods, based on Gaussian Process Regression, we are developing to reduce the number of d.o.f., while still capturing the essential features of the carrier population dynamics.


Last Update / Reviewed: February 7, 2018